RapidIO InteroperabilityRapidIO Interoperability Testing by FET/RIOLAB
Leveraging the RapidIO® Trade Association’s common hardware interoperability platform (HIP) and interoperability specification checklist, RIOLAB, a division of Fabric Embedded Tools, is the world’s first independent RapidIO® Interoperability Lab. A state-of-the-art, independent testing facility, RIOLAB provides the RapidIO eco-system with device interoperability and specification compliance testing to meet the growing needs of silicon vendors and OEMs. Originally launched in February 2006 the facility continues to receive overwhelming support from the RapidIO eco-system including Altera, Ericsson, Freescale Semiconductor, Integrated Device Technologies, Lucent Technologies, Texas Instruments, Tundra Semiconductor, Xilinx, and other members of the RapidIO Trade Association Steering Committee, industry experts, and OEMs. “From its inception, the RapidIO Trade Association recognized that an independent test lab was a key milestone in the maturity of the standard that would facilitate widespread OEM design-ins,” said Tom Cox, executive director, RapidIO Trade Association. “It was clear that an independent facility was required to achieve “Repeatable and Quantitative” results.” RIOLAB addresses the need to ensure that components, systems and software using RapidIO® technology are compliant with the specification and have the ability to operate effectively together. Comprehensive interoperability testing increases the likelihood of achieving interoperability objectives in OEM designs and can result in significant savings in engineering time and costs. The lab is the only facility in existence that provides commercial semiconductor vendors, FPGA and ASIC manufacturers with an unbiased common vehicle for demonstrating device interoperability and specification compliance to the RapidIO standard. Visit Fabric Embedded Tools Corporation or RIOLAB for more information: www.FETCORP.com, www.RIO-LAB.com
RapidIO Interoperability and the RapidIO Bus Functional Model
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